Skip to main navigation
Skip to main content
Atomic Force Microscopy (AFM) can be used to obtain detailed, high throughput surface images down to the sub-micron level. BOB体育登录网址_欧宝体育官网平台-APP|下载 AFM system is an Agilent 5600LS Scanning Probe Microscope (SPM) with a fully programmable motorised stage for fast, accurate probe positioning. This can be used for imaging and mapping large specimens at atomic scale resolution.
